Large Area Profilometry for Topographic Raman Imaging
WITec´s award-winning TrueSurface Microscopy allows confocal Raman imaging along heavily inclined or very rough samples with the surface held in constant focus while maintaining the highest confocality. The core element of this revolutionary imaging mode is an integrated sensor for optical profilometry. It is directly installed at the microscope turret, which facilitates user-friendly and convenient operation.
The TrueSurface Principle
With this non-contact technique it is possible to scan the sample in the XY plane to reveal a topographic map of the sample. This map keeps the Raman laser in focus with the sample surface (or at any distance below the surface). The results are images revealing chemical and/or optical properties, even if the surface is rough or inclined.
The profilometric capabilities of the TrueSurface imaging mode allow scan ranges of up to 50x100 mm².
The large-area topographic coordinates from the profilometer measurement can be precisely correlated with the confocal Raman imaging data. In combination with AFM, TrueSurface can be used as a pre-inspection tool to determine topographic features of interest for high-resolution AFM investigations on large samples.
TrueSurface Microscopy can provide great benefits for a large variety of applications, including the characterization of micromechanical, medical, or semiconductor devices, the mapping of functionalized surfaces, or the imaging of biomedical or pharmaceutical material surface properties.
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