Raman Imaging Upgrade for the Atomic Force Microscope alpha300 A
Linking chemical information with topography structures
The Confocal Raman Imaging Upgrade option for the WITec alpha300 A Atomic Force Microscope allows the acquisition of Raman images from chemical investigations to be linked to the AFM topographic information from the same sample area. No transferring or touching of the sample is required as the two modes are easily accessible by just rotating the microscope turret. Even simultaneous AFM-Raman data acquisition is possible.
AFM image of the cross hatch pattern of a Si/SiGe strained epitaxial film on silicon. Scan range is 20 µm x 20 µm and the topography scale is 30 nm.
The Confocal Raman Imaging Upgrade comes with all the features provided by the WITec alpha300 R Confocal Raman Microscope. As the modular concept is also reflected in the WITec software tools, the AFM and Raman Imaging features are accessible by using a single software environment (WITec Control and WITec Project).
Left: Raman shift of the Si-Si stretching mode of the SiGe layer at 502 cm-1. Scan range is 20 µm x 20 µm. Image scale is from 500.5 cm-1 to 503.5 cm-1. Right: Single Raman spectrum.