From liquids to emulsions, solid samples, or coatings, etc. in the food technology diverse samples are analyzed on a regular basis. The flexible WITec imaging and analytical tools provide the opportunity to adjust the imaging technique to varying requirements. The samples can be comprehensively analyzed regarding their chemical and physical properties and depth profiles and 3D images can be generated to visualize the results in a clear and accessible manner.

WITec’s highly versatile instruments can combine various imaging techniques to significantly increase the insights provided by measurement results. Possible combinations which can be included in a single microscope setup include confocal Raman imaging, Atomic Force Microscopy (AFM), Nearfield-Microscopy (SNOM) and Scanning Electron Microscopy (SEM). Confocal Raman imaging provides chemical information, AFM detects topography, structure, and physical properties such as stiffness, adhesion, etc. of the sample’s surface, and SNOM high-resolution measurements can optically reach beyond the diffraction limit. All WITec instrument configurations can be upgraded at any point to adapt the system to new or extended requirements.