News

March 2020

Application Note on Raman Imaging of Semiconducting Materials

WITec has released a new Application Note that features measurements of semiconducting materials using 2D and 3D Raman imaging in combination with other techniques such as atomic force microscopy (AFM), scanning electron microscopy (SEM) and second or third harmonic generation (SHG, THG) microscopy. See how correlative techniques can characterize crystallinity, topography, stress fields and other properties on materials such as silicon, gallium nitride and molybdenum disulfide.