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Correlative Microscopy Techniques

The modular design of the WITec microscope systems allows to combine various imaging techniques such as Raman imaging, fluorescence, luminescence, atomic force microscopy (AFM), near-field microscopy (SNOM or NSOM) and scanning electron microscopy in one single instrument without compromising the analyzing and imaging quality.

The integrated WITec software interface enables user-friendly measurement control, quick and easy correlation of the results and image overlay.

On this image, you see beautiful correlative Raman-fluorescence microscopy on a biological cell. Green: GFP fluorescence; yellow, pink and white: Raman signal of nucleus, nucleoli and lipids, respectively.


Raman-SEM (RISE)

The Raman-SEM (RISE) combination is a unique correlative microscopy technique provided by WITec. Structures in the nm-range detected by Scanning Electron Microscopy (SEM) can be correlated to chemical Raman imaging from the same sample area.

More information about WITec's RISE Microscope

This picture shows correlative Raman-SEM (RISE) image of TiO2 particles. The Raman image is overlaid on the SEM image. Different modifications of TiO2 were analyzed by Raman microscopy (blue: anatase, red: rutile).

WITec Correlative Raman SEM TiO2

Raman-AFM

By combining confocal Raman imaging with AFM, the chemical composition of the sample can be linked with the surface characteristics. These two complementary techniques are available in combined Raman-AFM WITec microscopes for flexible and comprehensive sample characterization.

More information about WITec's Raman-AFM Microscope alpha300 RA

 

WITec Correlative Raman AFM Polymer Blend
Correlative Raman-AFM image of a polymer blend. Left: Topographic AFM image. Right: Raman image. Red, blue and green: different polymers of the blend.

Raman-SNOM

Combining Raman characterization with SNOM for optical imaging beyond the diffraction limit provides informative results for even challenging experimental requirement.

More information about WITec's Raman-SNOM Microscope alpha300 RS

WITec Correlative Raman AFM SNOM Photoluminescence WS2
Correlative AFM-Raman-SNOM-Photoluminescence microscopy of CVD-grown WS2 crystals.

Raman-Profilometry

One-pass topographic Raman Imaging (TrueSurface Microscopy) for operations on rough or inclined samples.

More information about WITec's Profilometry Microscopy TrueSurface

TrueSurface Paper Surface Topography Chemistry
Correlative Raman-Profilometry microscopy of cellulose fibers.